二手Rigaku ZSX primus波長(zhǎng)色散型熒光光譜，Rigaku，ZSX primus

95成新 1萬(wàn)起購(gòu)?。。?/strong>

 友情提示：該儀器95成新 現(xiàn)貨供應(yīng)  議價(jià)！

產(chǎn)品實(shí)拍圖：

X-射線(xiàn)熒光光譜儀(XRF)

1、儀器介紹

X-射線(xiàn)熒光光譜儀(XRF)，現(xiàn)有日本Rigaku公司生產(chǎn)的ZSX primus波長(zhǎng)色散型XRF一臺(tái)，及配套所必須的電源設(shè)備、冷循環(huán)水設(shè)備和前處理熔樣機(jī)等。X射線(xiàn)熒光光譜分析技術(shù)制樣簡(jiǎn)單、分析快速方便、應(yīng)用廣泛，可用于測(cè)定包括巖石、土壤、沉積物等在內(nèi)的各種地質(zhì)樣品的化學(xué)組成。分析元素范圍從Be(4)到U(92)，zui常見(jiàn)的是用于主量元素分析，如SiO₂、Al₂O₃、CaO、Fe₂O₃T、K₂O、MgO、MnO、Na₂O、P₂O₅、TiO₂、LOI等元素。

2、儀器功能和技術(shù)參數(shù)：

(1) 功能：定性分析、半定量分析和定量分析；

(2) X射線(xiàn)管：4KW超薄端窗型(30μm)、銠靶X射線(xiàn)管；

(3) 分光晶體：LiF(200)、Ge(111)、PET、RX25、LiF(220)；

(4) 進(jìn)樣器：48位自動(dòng)樣品交換器；

(5) 測(cè)角儀：SC：5-118度(2θ)；PC：13-148度(2θ)；

(6) 分析元素范圍：Be⁴-U⁹²；

(7) 線(xiàn)性范圍：10^-2 - 10^-6；

(8) 儀器穩(wěn)定度：≤0.05%；

(9) 測(cè)量誤差：<5%。

3、應(yīng)用和優(yōu)勢(shì)：

    XRF應(yīng)用廣泛，可用于巖石、礦物、土壤、植物、沉積物、冶金、礦業(yè)、鋼鐵、化工產(chǎn)品等樣品中常量和痕量的定量分析。具有快速方便、制樣簡(jiǎn)單、無(wú)損測(cè)量、分析元素寬、靈敏度高等優(yōu)點(diǎn)。

X-ray Fluorescence Spectrometer (XRF)

1、Instrument Introducation:

The wavelength dispersion X-ray fluorescence spectrometer (XRF) is ZSX primus, made by Rigaku, Japan, with a set of instruments of electrical power unit, cold circulating water equipment and automatic fusion machine. XRF is widely used for geological element analysis, including rocks, soils, sediments, etc, which is simplicity and convenience of operation. Its analyzable elements range is from Be (4) to U (92). XRF is most common for the analysis of major elements, such as SiO₂, Al₂O₃, CaO, Fe₂O₃T, K₂O, MgO, MnO, Na₂O, P₂O₅, TiO₂ and LOI.

2、Instrument Technical Parameters:

(1) Fucation: qualitative analysis, semi-quantitative analysis and quantitative analysis;

(2) X-ray tube: 4KW ultrathin end-window (30μm) Rh target X-ray tube;

(3) Analyzing crystals: LiF(200), Ge(111), PET, RX25, LiF(220)；

(4) Sample injector: 48-bit automatic sample changement;

(5) Angular instrument: SC: 5-118° (2θ); PC: 13-148° (2θ).

(6) Analyzable elements range: Be⁴-U⁹²;

(7) Linear range: 10^-2 - 10^-6;

(8) Stability: ≤0.05%;

(9) Analysis error: <5%.

3、Application and advantage

   XRF is widely used to analy major elements and trace elements in geological rocks, minerals, soils, plants, sediments, metallurgy, mining industry, steel, chemical products, etc. It is fast, convenient, simple, nondestructive, widely used and high sensitivity.